CPN CPE Computer Engineering Practice Questions - CPN CPE - Computer Engineering (CEN) Track (Nigeria) Exam

In VLSI design, what physical phenomenon is primarily responsible for the 'latch-up' condition in CMOS circuits?

The activation of parasitic bipolar junction transistors (BJTs) forming a silicon-controlled rectifier (SCR) path. The breakdown of the gate oxide due to excessive electrostatic discharge (ESD). The electromigration of metal atoms in the interconnect layers under high current densities. The injection of hot carriers into the oxide, causing a permanent shift in threshold voltage.

Correct Answer:

The activation of parasitic bipolar junction transistors (BJTs) forming a silicon-controlled rectifier (SCR) path.

Access more questions from this quiz

Continue to CPN CPE Computer Engineering Practice Questions - CPN CPE - Computer Engineering (CEN) Track (Nigeria) Exam for more practice questions and the full quiz experience.

Access More Questions